Book Information

• About
• News
• Errata

Data Tables

Access 71 data tables in pdf format* from the book appendix containing cryogenic properties of materials and cryostat design data.
Note: After opening the pdf file, use Control+F to rapidly search and find information

• Data Tables:
  English
• Data Tables:
  Chinese

Figure Index

Access high resolution pdf copies of each figure from this menu*

Figures by Chapter

• Chapter 1:
  Introduction and Cryogenic Liquids
• Chapter 2:
  Heat Transfer
• Chapter 3:
  Construction
• Chapter 4:
  Wiring and Connections
• Chapter 5:
  Temperature Measurement
• Chapter 6: Properties of Solids
• Chapter 7:
  Sample Holders
• Chapter 8:
  Sample Contacts
• Chapter 9:
  Critical-Current Measurements
• Chapter 10:
  Critical-Current Data Analysis

*Adobe Reader is required to view these figures

• click to get Adobe Reader

CHAPTER 7: SAMPLE HOLDERS

Click on any of the links below to download high resolution pdfs of any figure

FIG. 7.1
Example of a sample holder for measuring critical current in short, straight samples

FIG. 7.2
Two-lead arrangement and four-lead arrangement for measuring transport properties

FIG. 7.3
Tubular sample mount for measuring coiled conductors in the small bore of a high-field solenoidal magnet

FIG. 7.4
Dual sample holder for variable-angle measurements

FIG. 7.5
Thermal contraction of the radius ΔR/R on cooling from 293 K to 76 K for G-10 fiberglass-epoxy “rolled” tubes

FIG. 7.6
Composite sample holder engineered to match the thermal contraction of the sample

FIG. 7.7
Technique for reducing inductive noise voltage arising from magnetic-field variations or sample motion

FIG. 7.8
Noninductive winding scheme, where one of the voltage leads is wound counter to the test sample to minimize the loop area and induced electromagnetic noise

FIG. 7.9
Relevant lengths for voltage-tap placement and current-contact lengths

FIG. 7.10
Influence of current-transfer voltage on the voltage V vs. current I characteristic of a superconductor

FIG. 7.11
Current-transfer length xmin for typical Nb–Ti  and Nb3Sn multifilamentary superconductors

FIG. 7.12
Anomalous V–I characteristic of a short Nb–Ti sample

FIG. 7.13
Model of equipotential lines for the superconductor test setup and data shown in Fig. 7.12

FIG. 7.14
Good and bad supports for high-current testing of short samples

FIG. 7.15
Test mandrel for Nb–Ti superconductor

FIG. 7.16
Combination reaction-and-measurement mandrel for Nb3Sn

FIG. 7.17
Schematic illustration of spring-loaded pogo pins that press the test chip against a copper base support

FIG. 7.18
Test chip located in a wire-bond chip carrier or package

FIG. 7.19
Illustrations of wire-bond procedure

FIG. 7.20
Detailed illustration of a pogo pin for making electrical pressure contacts to small contact pads

FIG. 7.21
Fuzz buttons for making electrical pressure contacts to small contact pads or device leads

FIG. 7.22
Beryllium-copper contact microsprings

FIG. 7.23a
Third-harmonic technique for measuring transport properties of thin films - Experimental data plot

FIG. 7.23b
Third-harmonic technique for measuring transport properties of thin films - Calculated dependence of K

FIG. 7.24
Cross-sectional view of practical multifilamentary low-Tc superconducting composites

FIG. 7.25
Cross-sectional view of practical high-Tc superconducting composites

References
Listing of all References for Chapter 7 Figures